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Home Products Spectrophotometer Series SPM-28160 UV-VIS-NIR Spectrophotometer
SPM-28160 UV-VIS-NIR Spectrophotometer
280-1600nm, double‑beam, broadband, high resolution
Typical application scenarios
SPM-28160 UV-VIS-NIR Spectrophotometer is a double-beam UV-Vis-NIR spectrophotometer designed in compliance with GB/T 39552.2-2020, JJF1106, ISO 8980, and JJG 178, featuring broadband coverage, high precision, and high stability for material analysis. It is suitable for measuring characteristic absorption and spectral transmittance of flat-panel displays, optical components, architectural and specialty glasses, nanomaterials, solutions, and more over 280–1600 nm, enabling automated analysis of transmission/absorption spectra, absorbance, transmittance, and UV/IR radiation hazard filtering rates.
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Main characteristics
1.Double-beam design
Double-beam measurement ensures excellent stability and high repeatability for improved accuracy.
2.High resolution
High wavelength accuracy with spectral bandwidth as narrow as 2.0 nm, delivering superior spectral resolution and analytical precision.
3. Broadband coverage
Wavelength range of 280–1600 nm enables continuous UV-Vis-NIR scanning, ideal for analysis of lenses, photovoltaic materials, transparent/semi-transparent solutions, camouflage materials, coatings, and more.
4.Intelligent software
Intuitive and interactive user interface, providing analytical and computational functions for various industry parameters, with customizable and expandable software capabilities.
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Technical Specifications
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