Everfine
Everfine
Everfine
Photometric&Colorimetric&Electrical Test Systems for LED Packages and Modules Photometric&Colorimetric&Electrical Test Systems for LED Packages and Modules

系统简介

EVERFINE provides professional test systems for LED packages and modules; solutions include LED photometric&colorimetric&electrical measurement systems, LED luminous intensity angle test systems, LED aging-life test systems, LED thermology (thermal resistance, junction temperature) test systems, LED optical radiation(IEC62471 standard) test system, LED near field goniophotometer, EMC test system, and EVERFINE online test service.
远方光电
远方光电
远方光电
远方光电
远方光电
远方光电

LED Photometric&Colorimetric&Electrical measurement systems

The measurable items are luminous flux, luminous efficiency, relative spectral power distribution, chromaticity coordinates, CCT, dominant wavelength, peak wavelength, FWHM, CRI, purity, red ratio, SDCM, forward voltage, reverse voltage, forward current and reverse current, etc. Our system can simultaneously provide photometric outputs of steady state (DC) and transient (Pulses) measurement. It can also offer tests and analysis of the photometric&colorimetric&electrical characteristics of LEDs, COB LEDs, and LED modules at different case/junction temperatures.
远方光电
远方光电
远方光电
远方光电
远方光电
远方光电

LED Luminous Intensity and Beam Angle Measurement Systems

EVERFINE provides various measurement solutions to test LED packages and modules. These include spatial luminous intensity distribution, spatial color distribution, precise luminous flux, luminous intensity-forward current curve, forward current-forward voltage curve, luminous intensity-time curve, forward voltage, reverse voltage, forward current, and reverse current, etc.
远方光电
远方光电
远方光电
远方光电
远方光电
远方光电

LED Aging-Life Test Systems

EVERFINE’s LED aging-life test systems aim to provide normal/accelerated aging, lumen maintenance, temperature characteristics, and lifetime evaluation tests for single LED and LED modules. The measurable items include LED luminous efficacy-time variation curve(lumen maintenance characteristics), LED colorimetric quantities-case temperature-time variation curve(temperature characteristics curve), LED photometric quantities-case temperature-time variation curve(temperature characteristics curve), LED junction voltage-time variation, LED junction voltage-photometric quantities variation curve, LED junction voltage-colorimetric quantities variation curve, etc. Systems establish the LED model by data processing and output LED lifetime prediction under accelerated aging conditions. Systems also comply with international and domestic standards, including IESNA LM-80-2008, IES TM-21, ENERGY STAR, etc.
远方光电
远方光电
远方光电
远方光电
远方光电
远方光电

LED Thermology(Resistance Structure, Junction Temperature) Test Systems

EVERFINE’s thermal test systems are used to test and analyze the thermal resistance, reference thermal resistance, thermal correction parameter, junction temperature and electrical performance. Simultaneously provide I-V curves under different temperatures. They can also provides voltage-junction temperature-time curves, rapid change temperature curves, integral structure curve, differential structure curve, and LED spectrum curve, etc.
远方光电
远方光电
远方光电
远方光电
远方光电
远方光电

LED Spectral Radiation Safety Test Systems (IEC62471 Test)

EVERFINE’s safety test systems are used to measure spectral power distribution, spectral irradiance, spectral radiance, hazard efficacy of luminous radiation K, UV index, size of the apparent source, CCT, color coordinate, CRI, SDCM, etc. According to hazard level, systems can provide photobiological hazard levels classification for actinic UV hazard for eyes and skin, near UV hazard for eyes, retinal blue light hazard, retinal thermal hazard, etc. Comply with various international standards, including IEC/EN 62471, CIE S009, GB/T 20145, IEC/EN 60598, GB7000.1, 2005/32/ER, etc.
远方光电
远方光电
远方光电
远方光电
远方光电
远方光电

LED Near-Field Goniophotometers

GO-NR1000 is applicable for near-field photometric measurement of small-size light sources(LED, etc.). It can obtain the luminance distribution by establishing the ray model of light via algorithm to get total luminous flux, illuminate distribution of every plane, and far-field luminous intensity distribution. Combinations of ray model and optical software (Tracepro, etc.) offer more convenient and accurate methods for secondary optical design and development.
远方光电
远方光电

EMC Test Systems

EVERFINE’s EMC test systems are composed of electrostatic test systems and monitor systems of LED forward voltage and reverse leakage current. These systems also can automatically generate ESD component classification levels for tested devices. Systems are specially designed to comply with relative IEC and LED standards, which can undertake ESD tests and provide various discharge modes such as IEC, HBM, MM, and CDM.
EverfineEverfine

QR code

Everfine

Follow us

EverfineEverfine

Online
consultation

Everfine

WeChat Scan Code Contact

EverfineEverfine

Return
top