简体中文 繁體中文 English Deutsch Português Español Русский 한국어 日本語
Location:Home > News > Company News
Company News
International TLM standard Conference was Held in Canada. EVERFINE representative attended the conference and exhibited TLM measurement instrument
Time: 2017-02-20 Source: Hits: 172

With the rapid development and application of semiconductor solid-state lighting (SSL) products, especially intelligent lighting products, the phenomenon of TLM is attracted more attention in recent years. Up to now, there have being several international workgroups doing a lot of research about TLM. However, different standards for measuring and evaluating TLM are adopted by different study organization, making it impossible to do comparison between different laboratories and products.

On the background above, CIE Stakeholder Workshop for Temporal Light Modulation Standards for Lighting Systems was held in NRC(National Research Centre),Ottawa, Canada, in 8-9,february,2017. The conference is aimed to establish a standard work group and propose a corresponding standardization work scheme for TLM of lighting systems, promoting the work of international standard.

The conference is held by CIE, and some CIE officers, IEC professors,authors for IEEE 1789, standards setters of Energy Star Regulation, members of CIE TC 1-83 and specialists of IES,NEMA,IEA,ISA,ZVEI attended the conference. Qian Li, the deputy director of EVERFIEN Institute of Optoelectronic, as the representative of CALI(China Association of Lighting Industry) and SAC/TC224/SC3, participated in the conference, and exhibited EVERFINE LFA-3000 Light Flickering Analyzer and SFIM-300 Spectral Flickering Irradiance Meter to attendees.

 



Welcome speech by Dr. Yoshi Ohno, chair of CIE

 

Introduction for background and conference theme by Dr. Jenifer Veitch,
 Member of NRC of Canada, Minister of CIE D3

 

The biological effect of TLM to individuals includes visual perception, performance effects and neurobiological effects. So far, a lot of research is subjected to visual perception, performance effects, study for neurobiological effects of TLM is few, and it is a long-term work. For visual perception of TLM, it mainly includes visible flicker, stroboscopic effect and phantom array, and the later two effects can  only be observed indirectly through the relative movement between light source and observer.


Discussion about the future work (list on the wall)


It is widely believed that the definitions and methodologies for quantification for TLM has been given already, and related work about the measurement method and the metrological traceability is the urgent in the future work.

For the sake of not increasing the number of standards, the related quantities index of TLM for lighting products shall be increased in corresponding IEC standard about products, and related limit will also be given for different products. Because of a close relationship between quantity index and manufacturing cost, it is recommended the proposed quantities index limit shall not be too strict by some participants.

 

The short-term job and work manner (list on the wall)


 

The conference also contains products exhibition. Philips Lighting shows two standard TLA (temporal light artifacts) sources, which provides a very good understanding of visual perception under different flicker wavelength and modulation depth.

Moreover, Qian Li, the deputy director of EVERFIEN Institute of Optoelectronic, also exhibited EVERFINE LFA-3000 Light Flickering Analyzer, and compared the measurement abilities of the instrument with the experts attending the meeting. The result shows LFA-3000 can measure multiple TLM quantities quantities according to different standard, such as NM in IEEE 1789,Pst in IEC standard, and SVM in CIE TN006 etc.. The situ measurement results keep a good accordance with the standard TLA sources of Philip.

© 2012 EVERFINE Corporation. Zhejiang ICP Prepared 05003081

Quick Index: Illuminance Meter | LED Life Time | Spectroradiometer | Goniophotometer | Luminance Meter | Integrating Sphere | 62471 | LM-79 | LM-80 | Photometer | LED Test | LED Testing | EMC Tester | Spectrophotometer | Lamp Testing | Light Distribution